Members place 3rd in iCAN International Competition
August 17, 2013 Leave a Comment
IEEE Members, recently graduated Brian Oshiro & Ken Galvez, and undergraduate students Kenny Luong & Karlo Andrada are awarded 3rd Place in the 2013 International Contest of Applications in Nano-Micro Technology held in Barcelona, Spain; June 15th-20th, 2013.
Together they entered the contest with a “Vital Baby Monitor System” (VBMS). Designed to lower the risk of Sudden Infant Death Syndrome (SIDS) monitoring a baby’s body temperature, heart-rate, and movement. The VBMS was designed to alert parents to health alarming readings and informs parents if their child is awake while calming the baby with tranquil music.